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- Our products, including a muti-wavelength
single-shot surface profiler MW-500, were
exhibited at the Semicon Japan at Makuhari on
December 7-9, 2011.
- Toray Engineering Co., Ltd. received the
Technology Award of the Japan Society for
Precision Engineering 2011.
Award-winning technology: Development of
multi-wavelength single-shot interferometry.
- A talk was presented; "Multi-wavelength
single-shot interferometry without carrier fringe
introduction",
10th International Conference on Quality Control
by Artificial Vision (QCAV2011) [Saint-Etienne,
France](2011.6)
- Our products were exhibited at the Semicon
Japan at Makuhari on December 1-3, 2010.
- Our products were exhibited at the Semicon
Japan at Makuhari on December 2-4, 2009.
- A talk was presented; "Multi-Wavelength
Single-Shot Interferometry", ISOT 2009 (International
Symposium on Optomechatronic Technologies)
(2009.9; Istanbul) [Innovation Award Nominated]
- An invited talk was presented; "Recent Trends
in Super-Precision 3D Measurement Technology -
Innovative Algorithms for Optical Interferometry
and their Applications-", FCV 2009(15th
Japan-Korea Joint Workshop on Frontiers of
Computer Vision),Korea Student Advancement
Center, Andong, Korea (Feb.5-7, 2009).
- Our products were exhibited at the Semicon
Japan at Makuhari on December 3-5, 2008.
- A new product, the Glass
Stress Analyzer , was released on Oct.28, 2008.
- Our products were exhibited at the Semicon
West at San Francisco on July 15-17, 2008.
- Our products were exhibited at the Fine-Tech
Show at Tokyo Big Sight on April
16-18, 2008.
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