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Last updated: 08/01/01
3D Museum
by SP-500 Surface Profiler
Please click to enlarge the image.
Metals
Plastics
Semiconductors/Wafers
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Si Wafer |
PSI |
FOV: 80um Height: 1nm |
Si Wafer |
PSI |
FOV: 80um Height: 2nm |
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Si Wafer |
PSI |
FOV: 80um Height: 7nm |
Si Wafer |
PSI |
FOV: 200um Height: 25nm |
Semiconductors/Bumps
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Bump(Stud) |
VSI |
FOV: 0.8mm Height: 40um |
Bump(Stud) |
VSI |
FOV: 0.8mm Height: 40um |
Semiconductors/Others
Flat Panel Display
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Column Spacer |
VSI |
FOV: 70um Height: 4um |
Column Spacer imaged by "SPIP" software |
VSI | FOV: 70um Height: 4um |
Magnetic Heads
Optical Parts
Step Height
Film Thickness NEW
Cell Gap
pdf file of this page (270KB)
Related products and technology
| SP-500 (Surface Profiler) |
| SP-500B (Wafer Bump Inspection System) |
| SP-500P (Panel Surface Profiling System) |
| Technology of Interferometric Surface Profiler (Sorry in Japanese) |
For more
information:
Toray Engineering Co., Ltd.
Electronics Division
Tel:+81-77-544-1635
Fax:+81-77-544-6091
http://www.scn.tv/user/torayins/
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