Last modified: 2008/05/25

Products

Bump Inspection System
SP-500B

SP-500BW The SP-500B Bump Inspection System is the latest version of Toray's Automatic Bump Inspection System Series, which has a long history of more than ten years.

The SP-500B automatically measures the heights, coplanarity, shapes and positions of the bumps on wafers or IC chips.

The 3D profiling technique is based on a newly developed optical interferometry, which has the world fastest measurement speed with sub-micron accuracy of height measurement.

A new product, the Wafer-Bump Inspection System SP-500BW was press-released. (Dec. 2003)

Features

  • Fully automatic bump inspection
  • Superior repeatability and accuracy with non-contact and non-destructive
  • Revolutionarily fast scan speed of maximum 100um/sec achieved by a new signal processing algorithm
  • Full three-dimensional areal surface measurement
  • Wide measurement range of 0-100um (max. 350 um; optional)
  • Objective selectable for optimum Field-Of-View
  • Easy operation with Windows NT in Japanese/English
  • DSP board for high-speed signal processing (optional)
  • Automatic wafer loading (optional)

Specifications

Measurement Technique Narrow-band White-Light Interferometry
Algorithm SB Algorithm; jointly invented by Tokyo Institute of Technology and Toray Engineering Co., Ltd.; Patent-Pending
Samples Wafer (maximum size: 200mm); IC Chips on a tray
Load/Unload Manual/Auto
Items to be Inspected (1)Height; Coplanarity
(2)Size (Diameter; Area)
(3)Position
(4)Shape (Roundness, etc)
Repeatability Dependent on the various parameters;
[Example] Sigma(Average)= 20 nm for Standard Step Height
Range of Height Measurement 0 - 100 um (Optional: 0 - 350 um)
Height Resolution 1nm
Vertical Scan Speed Selectable; Max. 100 um/sec
Focus Automatic
Horizontal Resolution Selectable; Max. 512x480 pixels [Optional: 1400x1000 pixels]
Objectives Selectable; 2.5X, 5X, 10X, 20X, 50X
DSP Board Optional
Throughput Dependent on various conditions; as high as 250 bumps/sec
Computer System/OS PC/Windows NT
Cleaness Compativble to Class 10-100
Utilities AC 200V, 1 KVA; Air; Vacuum

Subject to change without notice.

Test Results

Bump

IC Bump

IC Bump (3D Display)

Chip-Map Wafer-Map

Chip Map

Wafer Map

 

For more information:
Toray Engineering Co., Ltd.
Electronics Division

Tel:(077)544-1635
Fax:(077)544-6091
http://www.scn.tv/corp/torayins/

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