Last modified: 2008/05/25
Products
Bump
Inspection System
SP-500B
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The SP-500B Bump Inspection System
is the latest version of Toray's Automatic Bump
Inspection System Series, which has a long history of
more than ten years. The SP-500B automatically measures the heights, coplanarity, shapes and positions of the bumps on wafers or IC chips. The 3D profiling technique is based on a newly developed optical interferometry, which has the world fastest measurement speed with sub-micron accuracy of height measurement. A new product, the Wafer-Bump Inspection System SP-500BW was press-released. (Dec. 2003) |
Features
|
Specifications
| Measurement Technique | Narrow-band White-Light Interferometry |
| Algorithm | SB Algorithm; jointly invented by Tokyo Institute of Technology and Toray Engineering Co., Ltd.; Patent-Pending |
| Samples | Wafer (maximum size: 200mm); IC Chips on a tray |
| Load/Unload | Manual/Auto |
| Items to be Inspected | (1)Height; Coplanarity (2)Size (Diameter; Area) (3)Position (4)Shape (Roundness, etc) |
| Repeatability | Dependent on the various parameters; [Example] Sigma(Average)= 20 nm for Standard Step Height |
| Range of Height Measurement | 0 - 100 um (Optional: 0 - 350 um) |
| Height Resolution | 1nm |
| Vertical Scan Speed | Selectable; Max. 100 um/sec |
| Focus | Automatic |
| Horizontal Resolution | Selectable; Max. 512x480 pixels [Optional: 1400x1000 pixels] |
| Objectives | Selectable; 2.5X, 5X, 10X, 20X, 50X |
| DSP Board | Optional |
| Throughput | Dependent on various conditions; as high as 250 bumps/sec |
| Computer System/OS | PC/Windows NT |
| Cleaness | Compativble to Class 10-100 |
| Utilities | AC 200V, 1 KVA; Air; Vacuum |
Subject to change without notice.
Test Results
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IC Bump |
IC Bump (3D Display) |
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Chip Map |
Wafer Map |
For
more information:
Toray Engineering Co., Ltd.
Electronics Division
Tel:(077)544-1635
Fax:(077)544-6091
http://www.scn.tv/corp/torayins/
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