Last Update: 10/02/24

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	Topics
	Our products were exhibited at the Semicon Japan at Makuhari on December 2-4, 2009. NEW A talk was presented; "Multi-Wavelength Single-Shot Interferometry", ISOT 2009 (International Symposium on Optomechatronic Technologies) (2009.9; Istanbul) [Innovation Award Nominated]. An invited talk was presented; "Recent Trends in Super-Precision 3D Measurement Technology - Innovative Algorithms for Optical Interferometry and their Applications-", FCV 2009(15th Japan-Korea Joint Workshop on Frontiers of Computer Vision),Korea Student Advancement Center, Andong, Korea (Feb.5-7, 2009). Our products were exhibited at the Semicon Japan at Makuhari on December 3-5, 2008. A new product, the Glass Stress Analyzer , was released on Oct.28, 2008. Our products were exhibited at the Semicon West at San Francisco on July 15-17, 2008. Our products were exhibited at the Fine-Tech Show at Tokyo Big Sight on April 16-18, 2008.
	Past Topics (1998-2007).

	Products
	Semiconductor Applications Wafer Pattern Inspection System "INSPECTRA" Wafer Etch-Pit Counter MV-550EP Bump Inspection System SP-500B Panel Surface Profiling System SP-500P
	Thin Film Magnetic Head Applications Wafer Pattern Inspection INSPECTRA-1000H Slider Inspection INSPECTRA-1000B Pole Inspection MV-550H ABS Inspection MV-550WF Bow Measurement MV-550HB Pattern Width Measurement MV-550HM Surface Profiler SP-500
	Flat Panel Display Applications Particle Counter IQ-530 Particle Inspection System for FPD HS-830 Film Thickness Measurement System OP-50L Spacer Counter MV-550S FPD Panel Surface Profiler SP-500L FPD Pattern Inspection System FI-500
	General Purpose Film Thickness Measurement OP-50S Surface Profiler SP-500 Surface Profiling Module SP-500M Film Profiler SP-500F [unified with SP-700] Surface Profiler SP-700 Glass Stress Measurement System KMS-5000 (Sorry in Japanese) NEW

	Technology
	Technology of "Inspectra" (Sorry in Japanese) Technology of Film Thickness Measurement (Sorry in Japanese) Technology of Particle Counter (Sorry in Japanese) Technology of Surface Profiler Backnumbers (Sorry in Japanese) NEW

3D Museum by Surface Profiler

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