Last Update: 08/05/25

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Past Topics ('98/7-'07/12)

2007

　
  • Our products were exhibited at the Semicon Japan (Makuhari; Dec. 5-7; Booth #3D-617).
  • An invited talk was presented on new technologies of our SP-700 surface profiler at ISOT 2007 (International Symposium on Optomechatronic Technologies), Oct. 8-10, Lausanne Switzerland.
  • The film analysis method, which is incorporated in SP-700, was patented in Japan in March 2007.
  • Surface Profiler SP-700 was exhibited at the Micro-machine/MEMS Show at Tokyo Big Sight on July 25-27, 2007.
  • The URL of this site was changed from http://www.scn.tv/corp/torayins/ to http://www.scn.tv/user/torayins/.
  • Our products were exhibited at the Fine-Tech Show at Tokyo Big Sight on April 11-13, 2007.

2006

　
  • An invited talk was presented on the new technologies of our SP-500 surface profiler at the ViEW 2006, Yokohama, December 7-8, 2006.
  • Our products were exhibited at the Semicon Japan (Makuhari; Dec. 6-8; Booth #3C-801, 9A-209).
  • An invited talk was presented on the new technologies of our SP-500 surface profiler at the OSA OF&T 2006 conference, Rochester NY, October 9-11, 2006.
  • Two invited talks were presented on the new technologies of our SP-500 surface profiler at the SPIE Optics East 2006 conference, Boston, October 1-4, 2006.
  • Our products were exhibited at the TORAY ENGINEERING booth in the Semicon West 2006.
  • Our products were exhibited at the Fine-Tech Show at Tokyo Big Sight on April 19-21, 2006.
  • A new product, the Film Profiler SP-700, was press-released. (April 17, 2006)

2005

　
  • Our products were exhibited at the Semicon Japan (Makuhari; Dec. 7-9; Booth 7A-301).
  • Wafer Pattern Inspection System INSPECTRA-EXII was exhibited at the TOPCO Scientific Co., Ltd booth in the Semicon Taiwan held at Taipei World Trade Center from September 12 till 14.
  • Our products were exhibited at the TORAY ENGINEERING booth in the Semicon West held at San Francisco from July 12 till 14.
  • Our Particle Inspection System for FPD HS-830 won the Advanced Display of the Year 2005(ADY) Award.
  • Our products were exhibited at the Fine-Tech Show at Tokyo Big Sight on April 20-22.
  • An oral presentation was made on a new algorithm for SP-500 in the JSPE 2005 Spring Conference held at Tokyo on March 16-18, 2005.
  • Our products were exhibited at the Nanotech 2005 (Tokyo Big Sight; Feb. 23-25, 2005).

2004

　
  • Our products were exhibited at the Semicon Japan (Makuhari; Dec. 1-3).
  • An oral presentation was made on a new algorithm for SP-500 in the JSPE 2004 Autumn Conference held at Matsue on September 15-17, 2004.
  • An oral presentation was made on the Film Profiler SP-500F in the SICE 2004 Annual Conference held at Sapporo on August 4-6, 2004.
  • We have found that all e-mails for torayins@mx.scn.tv didn't reach us since June 9th because of the provider's mail-box overflow. The trouble was resolved today. We are sorry for any incovenience. (June 24, 2004)
  • Our products were exhibited at the Fine-Tech Show at Tokyo Big Sight on June 30-July 2.
  • The SB algorithm was awarded the Tejima Invention Award, Tejima Memorial Foundation. (March 2004)

2003

　
  • An oral presentation was made on the Film Profiler SP-500F in the View 2003 Conference held at Yokohama on December 3-5, 2003. It received the Best Paper Award.
  • Two new products, the Wafer-Bump Inspection System SP-500BW and the Wafer-Edge Inspection System WE-1000, were press-released. (Dec. 2003)
  • Our products were exhibited at the Semicon Japan (Makuhari; Dec. 3-5).
  • Our products were exhibited at the following shows:

    Semicon West (San Francisco; July 14-16)
    Fine Technology Japan (Tokyo Big Sight; July 2-4)
    Optical Instrument (Yokohama; June 19-21)
    JPCA Show (Tokyo Big Sight; June 4-6)
    BIO EXPO JAPAN (Tokyo Big Sight; May. 14-16)

  • Our new signal processing algorithm (SB algorithm) for SP-500 was patented in the USA.
  • A new product, FI-500, was press-released.
  • Into the 3D Museum, some test results are added which were obtained by use of the new optional software which enables simultaneuos measurement of the front and rear surface profiles and the thickness of a transparent film on any substrates.

2002

  • Our products were exhibited at the Semicon Japan (Dec.4-6) at Makuhari Messe.
  • A new optional software was released for the surface profiler SP-500, which enables simultaneuos measurement of the front and rear surface profiles and the thickness of a transparent film on any substrates.
  • Our products were exhibited at the Scientific Instrument Show held at Tokyo Big Sight on Nov. 20-22.
  • Our products were exhibited at the LCD International held at Pacifico Yokohama on Oct.30-Nov.1.
  • Our products were exhibited at the SEMICON TAIWAN held at Taipei on September 16-18.
  • As new models of our surface profiler, Surface Profiling Module SP-500M and FPD Panel Surface Profiler SP-500L were released.
  • Our products were exhibited at the TORAY ENGINEERING booth in the Semicon West held at San Jose on July 17-19, and San Francisco on July 22-24. [Booth #9710A at SJ; Booth #6454, North Hall at SF]
  • Our products were exhibited at the Fine-Tech Show held at Tokyo Big Sight on July 3-5.
  • Our new product, Panel Surface Profiling System SP-500P, was presented at the JPCA Show at Tokyo on June 5-7th.
  • A presentation was made on the Particle Inspection System HS-730 in the SID 2002 Conference held at Boston, USA, on May 19-24, 2002.
  • As a new model of our surface profiler, the high-res camera type SP-500HR was released.
  • The surface profiler SP-500 was introduced in the latest edition of "Technology of Tokyo Institute of Technology" published by FCRC,Tokyo Institute of Technology.
  • A new English pamphlet, "Toray Engineering and Electronics Business Outline", was published. Please apply for from mail to & info request.

2001

  • An oral presentation was made on the surface profiler SP-500 in the View 2001 Conference held at Yokohama on December 6-7, 2001. It was selected as one of the three best papers.
  • Our products were exhibited at the Semicon Japan at Makuhari and the International Imaging Show at Pacifico Yokohama on December 5-7th.
  • An oral presentation was made on the surface profiler SP-500 in the Sensing Forum held at Sapporo on October 3-4, 2001.
  • An invited presentation was made on our technologies in the symposium held at Kyushu Sangyou Univ. on Sept. 22.
  • Our products were exhibited at the TORAY booth (Hall-II #3815) in the Semicon Taiwan held at Taipei on September 17th-19th.
  • A presentation was made on the surface profiler SP-500 in the SPIE Annual Meeting held at San Diego on August 1st, 2001.
  • A new Particle Inspection System, "HS series" and a new surface profiler "SP-500DS", were press-released. (01/07/18)
  • A paper on the development of our SP-500 Surface Profiler won the SICE(Society of Instrument and Control Engineers) 2001 Technology Award.
  • Our products were exhibited at the TORAY ENGINEERING booth in the Semicon West held at San Francisco and San Jose from July 16 till 18 and from July 18 till 20, respectively.
  • Our products were exhibited at the TORAY ENGINEERING booth [#13-50] in the Fine Process Technology Japan held at Tokyo Big Site on July 17th-19th.
  • An invited presentation was made on our technologies in the PRMU conference held at Kagawa Univ. on June 21st.
  • A presentation was made on the surface profiler SP-500 in the Optical Instrumentation Symposium held at Yokohama on June 6th.
  • A presentation was made on the surface profiler SP-500 in the SampTA Conference held at Orlando, USA from May 14th through 17th.
  • A presentations was made on the surface profiler SP-500 in the 45th SCI Annual Conference held at Osaka from May 8th through 10th.
  • A new Bump Inspection System, "SP-500B", was released.

2000

  • Our new products, the wafer inspection system, "INSPECTRA 1000SX-III", and the surface profiler, "SP-500", were exhibited at the SEMICON Japan 00 held at Makuhari on December 6-8.
  • Our surface profiler, "SP-500", was introduced on the magazine, NIKKEI MECHANICAL, October 2000 issue.
  • Our surface profiler, "SP-500", was introduced in the magazine, New Technology Japan, October 2000, issued by JETRO, as a newly developed technology in Japan.
  • Two presentations were made on the particle counter IQ-530 and the surface profiler SP-500 in the 39th SICE Annual Conference held at Iizuka from July 26th through 28th.

  • Our surface profiler, "SP-500", was introduced in the NHK TV news program, "Close-Up Gendai", on July 25th.
  • A new surface profiler, "SP-500", was released. To make the measurement speed much faster than the conventional ones, it uses a new signal processing technique which was invented jointly by Toray Engineering Co., Ltd. and the Tokyo Institute of Technology.
  • Our products were exhibited at the TORAY ENGINEERING booth in the Fine Process Technology Japan.
  • Our Inspection Equipment business unit was transfered to Toray Engineering Co., Ltd. on June 1st, 2000. We hope you will extend to us such continuous favors and close cooperation as before.

1999

  • A new version of our wafer inspection system, "INSPECTRA 1000SX-III", was exhibited at the SEMICON Japan 99 held at Makuhari on December 1-3.
  • Three products were exhibited at the TORAY booth in the Fine Process Technology Japan.
  • A presentation was made on our Particle Counter IQ-530 at the Display Works 99/Conference.
  • A new version of our wafer inspection system, "INSPECTRA 1000SX-II", was released.

1998

  • Toray's Particle Counter IQ-530 won the grand prize of the ADY'98 Awards.


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